Surgecraft SDT06/0R6 Surge Impulse Tester
Improved basic performances of impulse tester (such as signal-to-noise ratio, frequency characteristic, etc.) enabled more detailed Partial Discharge noise detection.
Base line fluctuation of AC or DC coupling due to the temperature change is controlled by the auto zero adjustment; as a result, precision of PASS/FAIL detection has improved. The auto zero adjustment is essential for materializing 10-bit voltage resolution tester.
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Output Voltage |
200V - 6,000V （10V-step） |
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Pulse Energy |
Max. 0.18 joules |
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Inductance Range |
10uH or over (recommendable) |
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CPU |
Hitachi SH4 （Renesas Technology Corp.） |
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Sampling Speed |
10-bit/(10nano-sec. (1024 Voltage Resolution, 100MHz) |
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Sweep Range (time axis) |
400 ranges (liner) |
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Master Waveform Memory |
225 types in the main memory, Data downloadable to PC |
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LCD Display |
640 x 480 dots (VGA), 8.4" TFT Color LCD, 256-color display |
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Waveform Display Area |
620 x 340 dots |
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Detection Method |
Differential Area, Partial Discharge, 2nd Zero Cross Point |
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Dimensions/Weight |
450(W) x 310(D) x 180(H) mm, approx. 9kgrams. |
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Power Requirements |
AC100V - 240V ±5%、 50/60Hz |
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Interface |
RS-232C、LAN （Option） |
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Accessories |
AC Power Cable (1.5m x 1), High Voltage Test Cable (1.5m x 1) |
l10-bit A/C Converter is adopted. High resolution provides extremely precise testing.
lImproved basic performances of impulse tester (such as signal-to-noise ratio, frequency characteristic, etc.) enabled more detailed Partial Discharge noise detection.
lBase line fluctuation of AC or DC coupling due to the temperature change is controlled by the auto zero adjustment; as a result, precision of PASS/FAIL detection has improved. The auto zero adjustment is essential for materializing 10-bit voltage resolution tester.
lEstimation of the inductance of master coil can be performed. Because the estimation is calculated by using high voltage, the estimated value may be different from the value of an LCR meter.
l225 types of master waveform can be stored in the main memory. Also, master waveforms and test waveforms can be displayed on PC.
lStatistical data such as percent defective, variance, etc. can be displayed in graph.
lThis tester can be remote-controlled on PC.