• HIOKI 3506-10 Capacitance Meter

HIOKI 3506-10 Capacitance Meter

• High-speed analog test time of 0.6 ms (at 1 MHz)
• Improved noise resistance and enhanced repeatability in measurement precision even for production lines
• 1 kHz and 1 MHz measurement frequency supports stable low capacitance testing with taping machines
• BIN function, for easy component screening
Model : HIOKI 3506-10

Measurement parameters

C (Capacitance), D (loss coefficient, tan δ), Q (1/tan δ)

Measurement range

C: 0.001 fF to 15.0000 μF, D: 0.00001 to 1.99999, Q: 0.0 to 19999.9

Basic accuracy

(Typ.) C: ±0.14 % rdg., D: ±0.0013

Measurement frequency

1 kHz, 1 MHz

Measurement signal level

500 mV, 1 V rms

Output impedance

1 Ω (at 1 kHz in 2.2 μF and higher ranges), 20 Ω (in ranges other than the above)

Display

LED (six digits, full scale count depends on measurement range)

Measurement time

1.5 ms: 1 MHz, 2.0 ms: 1 kHz (Typ. value. Depends on measurement configuration settings)

Functions

BIN (measurement values can be classified by rank), Trigger-synchronous output, Setting configurations can be stored, Comparator, Averaging, Low-C reject (bad contact detection), Chatter detection, Current detection circuit monitoring, Applied voltage value monitoring, EXT. I/O, RS-232C, GP-IB

Power supply

Selectable from 100, 120, 220 or 240 V AC ±10 %, 50/60 Hz 40 VA max.

Dimensions and mass

260 mm (10.24 in) W × 100 mm (3.94 in) H × 298 mm (11.73 in) D, 4.8 kg (169.3 oz)

Accessories

Power cord × 1, Instruction manual × 1, Spare fuse × 1

• High-speed analog test time of 0.6 ms (at 1 MHz)

• Improved noise resistance and enhanced repeatability in measurement precision even for production lines

• 1 kHz and 1 MHz measurement frequency supports stable low capacitance testing with taping machines

• BIN function, for easy component screening

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