• HIOKI IM3523 Capacitance Meters

HIOKI IM3523 Capacitance Meters

• ±0.05% accuracy with wide measurement range (DC, 40Hz to 200kHz, 5mV to 5V, 10uA to 50mA)
• Non-stop testing over mixed measurement conditions such as C-D(120 Hz) and ESR(100 kHz) at 10 times the speed of previous models (compared with Model 3532-50)
• Built-in comparator and BIN functions
• Rapid 2msec test time
Model : HIOKI IM3523

Measurement modes

LCR (Measurement with single condition), Continuous testing (Continuous measurement under saved conditions)

Measurement parameters

Z, Y, θ, X, G, B, Q, Rdc (DC resistance), Rs (ESR), Rp, Ls, Lp, Cs, Cp, D (tanδ), σ, ε

Measurement range

100 mΩ to 100 MΩ, 10 ranges (All parameters defined in terms of Z.)

Displayable range

Z, Y, Rs, Rp, Rdc, X, G, B, Ls, Lp, Cs, Cp :

± (0.00000 [unit] to 9.99999G [unit]) Real value display for Z and Y only

θ: ± (0.000° to 180.000°), D: ± (0.00000 to 9.99999)

Q: ± (0.00 to 99999.9), Δ%: ± (0.0000% to 999.999%)

Basic accuracy

Z : ±0.05% rdg. θ: ±0.03°

Measurement frequency

40 Hz to 200 kHz (5 digits setting resolution)

Measurement signal level

V mode, CV mode: 5 mV to 5 Vrms, 1 mVrms steps

CC mode: 10 μA to 50 mArms, 10 μArms steps

Output impedance

100 Ω

Display

Monochrome LCD

Measurement time

2 ms (1 kHz, FAST, representative value)

Functions

Comparator, BIN measurement (classify function), Panel loading/saving, Memory function

Interfaces

EXT I/O (handler), USB communication (high-speed)

Optional: Choose 1 from RS-232C, GP-IB, or LAN

Power supply

100 to 240 V AC, 50/60 Hz, 50 VA max

Dimensions and mass

260 mm (10.24 in) W × 88 mm (3.46 in) H × 203 mm (7.99 in) D, 2.4 kg (84.7 oz)

Accessories

Power cord × 1 , Instruction manual × 1, CD-R (Includes PC commands and sample software) × 1

• ±0.05% accuracy with wide measurement range (DC, 40Hz to 200kHz, 5mV to 5V, 10uA to 50mA)

• Non-stop testing over mixed measurement conditions such as C-D(120 Hz) and ESR(100 kHz) at 10 times the speed of previous models (compared with Model 3532-50)

• Built-in comparator and BIN functions

• Rapid 2msec test time

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