• HIOKI IM7580A Impedance Analyzer

HIOKI IM7580A Impedance Analyzer

• 1 MHz to 300 MHz testing source frequency
• Fastest test speed of 0.5 msec
• ±0.72% rdg. basic accuracy
Model : HIOKI IM7580A

Measurement modes

LCR mode, Analyzer mode (Sweeps with measurement frequency and measurement level), Continuous measurement mode

Measurement parameters

Z, Y, θ, Rs (ESR), Rp, X, G, B, Cs, Cp, Ls, Lp, D (tanδ), Q

Measurable range

100 mΩ to 5 kΩ

Display range

Z: 0.00 m to 9.99999 GΩ / Rs, Rp, X: ± (0.00 m to 9.99999 GΩ)

Ls, Lp: ± (0.00000 n to 9.99999 GH) / Q: ± (0.00 to 9999.99)

θ: ± (0.000° to 180.000°), Cs, Cp: ± (0.00000 p to 9.99999 GF)

D: ± (0.00000 to 9.99999), Y: (0.000 n to 9.99999 GS)

G, B: ± (0.000 n to 9.99999 GS), Δ%: ± (0.000 % to 999.999 %)

Basic accuracy

Z: ±0.72 % rdg. θ: ±0.41°

Measurement frequency

1.0000 MHz to 300.00 MHz (5 digits resolution)

Measurement signal level

Power: -40.0 dBm to +7.0 dBm

Voltage: 4 mV to 1001 mVrms

Current: 0.09 mA to 20.02 mArms

Output impedance

50 Ω

Display

8.4-inch color TFT with touch screen

Measurement speeds *1

FAST: 0.5 ms (Analog measurement time, typical value)

Functions

Contact check, Comparator, BIN measurement (classification), Panel loading/saving, Memory function, Equivalent circuit analysis, Correlation compensation

Interfaces

EXT I/O (Handler), USB communication, USB memory, LAN, RS-232C (optional), GP-IB (optional)

Power supply

100 to 240 V AC, 50/60 Hz, 70 VA max.

Dimensions and mass

Main unit: 215 mm (8.46 in) W × 200 mm (7.87 in) H × 268 mm (10.55 in) D, 6.5 kg (229.3 oz)

Test head: 61 mm (2.40 in) W × 55 mm (2.17 in) H × 24 mm (0.94 in) D, 175 g (6.2 oz)

Accessories

Test head ×1, Connection cable ×1, Instruction manual ×1, LCR application disc (Communications user manual) ×1, Power cord ×1

• 1 MHz to 300 MHz testing source frequency

• Fastest test speed of 0.5 msec

• ±0.72% rdg. basic accuracy

• Half-rack size body and palm-sized test head

• Comprehensive contact check (via DCR testing, Hi-Z reject or waveform judgment)

• Make frequency sweeps, level sweeps and time interval measurements in Analyzer Mode

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