• DC, 4Hz to 8MHz measurement frequency
• High-speed measurement of 1ms (fastest time)
• High-precision measurement of ±0.05% rdg. (representative value)

• ±0.05% accuracy with wide measurement range
• (DC, 1mHz to 200kHz, 5mV to 5V, 10uA to 50mA)
• Non-stop testing over mixed measurement conditions such as C-D and ESR at 10 times the speed of previous models

• ±0.05% accuracy with wide measurement range (DC, 40Hz to 200kHz, 5mV to 5V, 10uA to 50mA)
• Non-stop testing over mixed measurement conditions such as C-D(120 Hz) and ESR(100 kHz) at 10 times the speed of previous models (compared with Model 3532-50)
• Built-in comparator and BIN functions
• Rapid 2msec test time

• LCR measurement, DCR measurement, sweep measurement, continuous measurement and high-speed testing achieved with one instrument
• High-speed testing, achieving maximum speeds of 1.5ms (1 kHz) and 0.5ms (100kHz) in LCR mode
• High-accuracy measurements, basic accuracy of Z parameter: ± 0.08%

• 1 MHz to 600 MHz testing source frequency
• Fastest test speed of 0.5 msec (Analog measurement time)
• ±0.65% rdg. basic accuracy

• Broad 1 mHz to 200 kHz signal source range supports measurements of ion behavior and solution resistance
• Continuous measuring and high-speed testing of LCR and sweep measurements with a single instrument
• Measure internal impedance of batteries with no load

• 1 MHz to 1.3 GHz testing source frequency
• Fastest test speed of 0.5 msec (Analog measurement time)
• 0.07% measured value variability (when measuring at 1GHz)

• 1 MHz to 300 MHz testing source frequency
• Fastest test speed of 0.5 msec
• ±0.72% rdg. basic accuracy