• 1 MHz to 3 GHz testing source frequency
• Fastest test speed of 0.5 msec (Analog measurement time)
• 0.07% measured value variability (When measuring a 1 nH coil at 3 GHz)

• 100 kHz to 300 MHz testing source frequency
• Fastest test speed of 0.5 msec (Analog measurement time)
• ±0.72% rdg. basic accuracy

3504-40 Built-in RS-232C interface
3504-50 Built-in GP-IB, RS-232C
3504-60 Built-in GP-IB, RS-232C

• High speed measurement: 5 ms (1 kHz) or 13 ms (120 Hz)
• Built-in high-speed comparator
• Measurement frequency: 1 kHz/120 Hz selectable
• From minute measurement with a maximum resolution of 0.001 pF to high-capacity measurement up to 1 F (depending on measurement frequency)

• The IM9000 can automatically select the equivalent circuit model from the five typical models to minimize the differences between the measured values and the ideal frequency characteristics derived from the analysis results
• An acceptance/rejection decision can be made for the L, C, and R elements comprising a part and the resonance sharpness (mechanical quality coefficient)
• A detailed decision can be made on the elements using the resonance of a piezoelectric element or inductor

• High-speed analog test time of 0.6 ms (at 1 MHz)
• Improved noise resistance and enhanced repeatability in measurement precision even for production lines
• 1 kHz and 1 MHz measurement frequency supports stable low capacitance testing with taping machines
• BIN function, for easy component screening